In today's electronic product design, the importance of pre-design of increasingly prominent, whether it is product manager, or engineering and technical staff are eager to find some simulation tools for early prediction of electromagnetic compatibility, analysis, evaluation, simulation and design, in order to speed up the design process, saving a lot of money and improve product quality. Apsim is a professional simulation and analysis tools on the signal integrity and electromagnetic compatibility analysis has obvious advantages, but powerful, distinctive, with a variety of analysis tools to help users early identification and resolution of potential EMI problems and then to ensure the normal operation of the circuit.

EMC DIAGNOSTIC EQUIPMENT

    • Three multifunction scanners

      EMC-Scanner can test the radiation from the components, cables , PCB and
      products , the system includes a XYZ motion mechanism , a spectrum analyzer
      a near -field probe between the spectrum analyzer and computer (with software)
      and one for GPIB card communication.

      The RSE-series is characterized by the 1mm step size, the Heat scanning feature and it's large working area (up to 600 x 400 x 200 mm). The RSE-series come in three different sizes.


      넶2 ¥ 0.00

    • Precision scanners

      The High Resolution or HRE-series is characterized by 25 µm ( 0.025 mm) step size and the IC-option which contains a high resolution real time inspection camera and specially designed high resolution near field probes.

      넶1 ¥ 0.00

    • S2 magnetic field probe set

      The magnetic field probes measure fast transient magnetic pulse fields and pulse currents in electronic devices and modules under the influence of extreme disturbances. The objective is to clarify magnetic field-related disturbance immunity phenomena which are triggered by burst or ESD processes.

      넶3 ¥ 0.00

    • E1 immunity development system

      The equipment under test (EUT) needs modification if functional faults occur in burst and ESD pulse tests (IEC 61000-4-2 and IEC 61000-4-4) on electronic modules and devices.

      The E1 immunity development system is used to quickly and precisely determine the causes of functional faults within the EUT. The user is able to find out how and why the individual conducting tracks and components are influenced. This allows him/her to initiate the optimum corrective action directly on the circuit or

      넶1 ¥ 0.00

    • RF Test Probes

      RF test probes in the IC chip pin end of the test , can be current, voltage
      detection and injection tests

      넶2 ¥ 0.00

    • IC Scanner

      Germany LANGER company develops and manufactures high-resolution electromagnetic
      compatible scanner , capable of 3 linear axes (x, y, z) or 4 axes ( 3 linear
      axes : x, y, z and α rotation) motion , resolution up to 5μm particularly
      suitable for electromagnetic interference scan integrated circuit (IC) as well
      as mobile phones and other handheld devices.

      넶1 ¥ 0.00

    • Near Field Probe RF1

      The near field probe type RF1 set contains magnetic field probes and an E-field probe for precompliance tests of printed circuit boards. Measuring the magnetic fields in the area of the module, conducting tracks, components and the modules of the supply system is the basis for selective measures to reduce disturbance emissions.

      넶2 ¥ 0.00

    • Near- field probe set RF2

      The near field probe type RF2 set contains magnetic field probes for precompliance tests of printed circuit boards. Measuring the magnetic fields in the area of the module, conducting tracks, components and the modules of the supply system is the basis for selective measures to reduce disturbance emissions.

      넶2 ¥ 0.00
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